Exploring the use of approximate TMR to mask transient faults in logic with low area overhead
| Autor: | Gomes, Iuri A.C., Martins, Mayler G.A., Reis, André I., Kastensmidt, Fernanda Lima |
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| Zdroj: | In Microelectronics Reliability August-September 2015 55(9-10):2072-2076 |
| Databáze: | ScienceDirect |
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