DC–DC's total ionizing dose hardness decrease in passive reserve mode

Autor: Kessarinskiy, L.N., Borisov, A.Y., Boychenko, D.V., Nikiforov, A.Y.
Zdroj: In Microelectronics Reliability August-September 2015 55(9-10):1527-1531
Databáze: ScienceDirect
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