Improvement of MOSFET matching characterization with calibrated multiplexed test structure
| Autor: | Welter, L., Scotto di Quaquero, J.L., Dreux, P., Lopez, L., Aziza, H., Portal, J.M. |
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| Zdroj: | In Microelectronics Reliability August-September 2015 55(9-10):1328-1333 |
| Databáze: | ScienceDirect |
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