General linearized model use for High Power Reliability Assessment test results: Conditions, procedure and case study
| Autor: | Bergès, C., Weber, Y., Soufflet, P. |
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| Zdroj: | In Microelectronics Reliability August-September 2015 55(9-10):1346-1350 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect