Impact of defect on I(V) instabilities observed on Ti/4H–SiC high voltage Schottky diodes
| Autor: | Abdelwahed, N., Troudi, M., Sghaier, N., Souifi, A. |
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| Zdroj: | In Microelectronics Reliability July 2015 55(8):1169-1173 |
| Databáze: | ScienceDirect |
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