Identification and analysis of power substrates degradations subjected to severe aging tests
| Autor: | Woirgard, E., Arabi, F., Sabbah, W., Martineau, D., Theolier, L., Azzopardi, S. |
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| Zdroj: | In Microelectronics Reliability August-September 2015 55(9-10):1961-1965 |
| Databáze: | ScienceDirect |
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