Effects of buffer compensation strategies on the electrical performance and RF reliability of AlGaN/GaN HEMTs

Autor: Bisi, D., Stocco, A., Rossetto, I., Meneghini, M., Rampazzo, F., Chini, A., Soci, F., Pantellini, A., Lanzieri, C., Gamarra, P., Lacam, C., Tordjman, M., di Forte-Poisson, M.-A., De Salvador, D., Bazzan, M., Meneghesso, G., Zanoni, E.
Zdroj: In Microelectronics Reliability August-September 2015 55(9-10):1662-1666
Databáze: ScienceDirect