ESD characterization of multi-finger RF nMOSFET transistors by TLP and transient interferometric mapping technique
| Autor: | Rigato, Matteo, Fleury, Clément, Heer, Michael, Capriotti, Mattia, Simbürger, Werner, Pogany, Dionyz |
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| Zdroj: | In Microelectronics Reliability August-September 2015 55(9-10):1471-1475 |
| Databáze: | ScienceDirect |
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