Study of short-circuit robustness of SiC MOSFETs, analysis of the failure modes and comparison with BJTs
| Autor: | Chen, Cheng, Labrousse, Denis, Lefebvre, Stéphane, Petit, Mickael, Buttay, Cyril, Morel, Hervé |
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| Zdroj: | In Microelectronics Reliability August-September 2015 55(9-10):1708-1713 |
| Databáze: | ScienceDirect |
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