Analysis and modeling of passive device degradation for a long-term electromagnetic emission study of a DC–DC converter
| Autor: | Huang, H., Boyer, A., Ben Dhia, S. |
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| Zdroj: | In Microelectronics Reliability August-September 2015 55(9-10):2061-2066 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect