20 GHz on-chip measurement of ESD waveform for system level analysis
| Autor: | Caignet, F., Nolhier, N., Bafleur, M., Wang, A., Mauran, N. |
|---|---|
| Zdroj: | In Microelectronics Reliability November 2015 55(11):2276-2283 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Caignet, F., Nolhier, N., Bafleur, M., Wang, A., Mauran, N. |
|---|---|
| Zdroj: | In Microelectronics Reliability November 2015 55(11):2276-2283 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect