Workload and temperature dependent evaluation of BTI-induced lifetime degradation in digital circuits
| Autor: | Eghbalkhah, Behzad, Kamal, Mehdi, Afzali-Kusha, Hassan, Afzali-Kusha, Ali, Ghaznavi-Ghoushchi, Mohammad Bagher, Pedram, Massoud |
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| Zdroj: | In Microelectronics Reliability July 2015 55(8):1152-1162 |
| Databáze: | ScienceDirect |
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