Implications of thermal instability on HBT power amplifier reliability
| Autor: | Chivukula, Venkata, Teeter, Douglas, Scott, Preston, Shah, Bhavin, Ji, Ming |
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| Zdroj: | In Microelectronics Reliability December 2014 54(12):2688-2696 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect