Fast power cycling protocols implemented in an automated test bench dedicated to IGBT module ageing
| Autor: | Forest, Francois, Rashed, Amgad, Huselstein, Jean-Jacques, Martiré, Thierry, Enrici, Philippe |
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| Zdroj: | In Microelectronics Reliability January 2015 55(1):81-92 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect