Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS
| Autor: | Dutertre, J.M., Possamai Bastos, R., Potin, O., Flottes, M.L., Rouzeyre, B., Di Natale, G., Sarafianos, A. |
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| Zdroj: | In Microelectronics Reliability September-October 2014 54(9-10):2289-2294 |
| Databáze: | ScienceDirect |
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