Performance drifts of N-MOSFETs under pulsed RF life test
| Autor: | Belaïd, M.A., Gares, M., Daoud, K., Latry, O. |
|---|---|
| Zdroj: | In Microelectronics Reliability September-October 2014 54(9-10):1851-1855 |
| Databáze: | ScienceDirect |
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| Autor: | Belaïd, M.A., Gares, M., Daoud, K., Latry, O. |
|---|---|
| Zdroj: | In Microelectronics Reliability September-October 2014 54(9-10):1851-1855 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect