Sn whisker evaluations in 3D microbumped structures
| Autor: | Vakanas, G.P., Vandecasteele, B., Schaubroek, D., De Messemaeker, J., Willems, G., Ashworth, M.A., Wilcox, G.D., De Wolf, I. |
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| Zdroj: | In Microelectronics Reliability September-October 2014 54(9-10):1982-1987 |
| Databáze: | ScienceDirect |
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