Energy distribution of positive charges in high-k dielectric

Autor: Hatta, S.W.M., Ji, Z., Zhang, J.F., Zhang, W.D., Soin, N., Kaczer, B., Gendt, S.D., Groeseneken, G.
Zdroj: In Microelectronics Reliability September-October 2014 54(9-10):2329-2333
Databáze: ScienceDirect