Temperature effects on the ruggedness of SiC Schottky diodes under surge current
| Autor: | León, J., Perpiñà, X., Banu, V., Montserrat, J., Berthou, M., Vellvehi, M., Godignon, P., Jordà, X. |
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| Zdroj: | In Microelectronics Reliability September-October 2014 54(9-10):2207-2212 |
| Databáze: | ScienceDirect |
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