Opens localization on silicon level in a Chip Scale Package using space domain reflectometry
| Autor: | Gaudestad, J., Talanov, V., Marchetti, M. |
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| Zdroj: | In Microelectronics Reliability September-November 2013 53(9-11):1418-1421 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect