Effective and reliable heat management for power devices exposed to cyclic short overload pulses
| Autor: | Nelhiebel, M., Illing, R., Detzel, Th., Wöhlert, S., Auer, B., Lanzerstorfer, S., Rogalli, M., Robl, W., Decker, S., Fugger, J., Ladurner, M. |
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| Zdroj: | In Microelectronics Reliability September-November 2013 53(9-11):1745-1749 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect