Field-effect control of breakdown paths in HfO2 based MIM structures
| Autor: | Saura, X., Lian, X., Jiménez, D., Miranda, E., Borrisé, X., Campabadal, F., Suñé, J. |
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| Zdroj: | In Microelectronics Reliability September-November 2013 53(9-11):1346-1350 |
| Databáze: | ScienceDirect |
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