Detectability of automotive power MOSFET on-resistance failure at high current induced by Wafer Fab process excursion
| Autor: | Weber, Y., Goxe, J., Castignolles, M. |
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| Zdroj: | In Microelectronics Reliability September-November 2013 53(9-11):1393-1398 |
| Databáze: | ScienceDirect |
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