Modelling methodology for thermal analysis of hot solder dip process

Autor: Stoyanov, Stoyan, Bailey, Chris, Alam, M.O., Yin, Chunyan, Best, Chris, Tollafield, Peter, Crawford, Rob, Parker, Mike, Scott, Jim
Zdroj: In Microelectronics Reliability August 2013 53(8):1055-1067
Databáze: ScienceDirect