Thermal resistance investigations on new leadframe-based LED packages and boards

Autor: Pardo, B., Gasse, A., Fargeix, A., Jakovenko, J., Werkhoven, R.J., Perpiñà, X., Jordà, X., Vellvehi, M., Van Weelden, T., Bancken, P.
Zdroj: In Microelectronics Reliability August 2013 53(8):1084-1094
Databáze: ScienceDirect