Experimental analysis of Ga2O3:Ti films grown on Si and glass substrates
| Autor: | Dakhel, A.A., Alnaser, W.E. |
|---|---|
| Zdroj: | In Microelectronics Reliability May 2013 53(5):676-680 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Dakhel, A.A., Alnaser, W.E. |
|---|---|
| Zdroj: | In Microelectronics Reliability May 2013 53(5):676-680 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect