Modeling and simulation of an active restoring mechanism for high reliability switches in RF-MEMS technology
| Autor: | Kuenzig, T., Schrag, G., Iannacci, J. |
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| Zdroj: | In Microelectronics Reliability September-October 2012 52(9-10):2235-2239 |
| Databáze: | ScienceDirect |
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