Read disturb on flash memories: Study on temperature annealing effect
| Autor: | Cola, L., De Tomasi, M., Enrici Vaion, R., Mervic, A., Zabberoni, P. |
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| Zdroj: | In Microelectronics Reliability September-October 2012 52(9-10):1803-1807 |
| Databáze: | ScienceDirect |
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