Study of layout influence on ruggedness of NPT-IGBT devices by physical modelling
| Autor: | Cortés, I., Perpiñà, X., Urresti, J., Jordà, X., Rebollo, J. |
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| Zdroj: | In Microelectronics Reliability September-October 2012 52(9-10):2471-2476 |
| Databáze: | ScienceDirect |
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