Variation tolerant on-chip degradation sensors for dynamic reliability management systems
| Autor: | Wang, Y., Enachescu, M., Cotofana, S.D., Fang, L. |
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| Zdroj: | In Microelectronics Reliability September-October 2012 52(9-10):1787-1791 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect