Diffusion growth of Cu3Sn phase in the bump and thin film Cu/Sn structures
Autor: | Dimcic, B., Labie, R., De Messemaeker, J., Vanstreels, K., Croes, K., Verlinden, B., De Wolf, I. |
---|---|
Zdroj: | In Microelectronics Reliability September-October 2012 52(9-10):1971-1974 |
Databáze: | ScienceDirect |
Externí odkaz: |