Diffusion growth of Cu3Sn phase in the bump and thin film Cu/Sn structures

Autor: Dimcic, B., Labie, R., De Messemaeker, J., Vanstreels, K., Croes, K., Verlinden, B., De Wolf, I.
Zdroj: In Microelectronics Reliability September-October 2012 52(9-10):1971-1974
Databáze: ScienceDirect