Effects of single vacancy defect position on the stability of carbon nanotubes
| Autor: | Poelma, R.H., Sadeghian, H., Koh, S., Zhang, G.Q. |
|---|---|
| Zdroj: | In Microelectronics Reliability July 2012 52(7):1279-1284 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Poelma, R.H., Sadeghian, H., Koh, S., Zhang, G.Q. |
|---|---|
| Zdroj: | In Microelectronics Reliability July 2012 52(7):1279-1284 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect