Shock impact reliability characterization of a handheld product in accelerated tests and use environment
| Autor: | Karppinen, J., Li, J., Pakarinen, J., Mattila, T.T., Paulasto-Kröckel, M. |
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| Zdroj: | In Microelectronics Reliability 2012 52(1):190-198 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect