Functional fault models for non-scan sequential circuits
| Autor: | Bareisa, Eduardas, Jusas, Vacius, Motiejunas, Kestutis, Seinauskas, Rimantas |
|---|---|
| Zdroj: | In Microelectronics Reliability 2011 51(12):2402-2411 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Bareisa, Eduardas, Jusas, Vacius, Motiejunas, Kestutis, Seinauskas, Rimantas |
|---|---|
| Zdroj: | In Microelectronics Reliability 2011 51(12):2402-2411 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect