Off-state drain breakdown mechanisms of VDMOS with anti-JFET implantation
| Autor: | Tam, Wing-Shan, Siu, Sik-Lam, Yang, Bing-Liang, Kok, Chi-Wah, Wong, Hei |
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| Zdroj: | In Microelectronics Reliability 2011 51(12):2064-2068 |
| Databáze: | ScienceDirect |
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