Failure mechanisms in advanced BCD technology during reliability qualification
| Autor: | van Hassel, J.G., Bock, G.A.D., van den Berg, G. |
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| Zdroj: | In Microelectronics Reliability September-November 2011 51(9-11):1697-1700 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect