Application of transient interferometric mapping method for ESD and latch-up analysis
Autor: | Pogany, D., Bychikhin, S., Heer, M., Mamanee, W., Gornik, E. |
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Zdroj: | In Microelectronics Reliability September-November 2011 51(9-11):1592-1596 |
Databáze: | ScienceDirect |
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