The combinational or selective usage of the laser SQUID microscope, the non-bias laser terahertz emission microscope, and fault simulations in non-electrical-contact fault localization
| Autor: | Nikawa, Kiyoshi, Yamashita, Masatsugu, Matsumoto, Toru, Miura, Katsuyoshi, Midoh, Yoshihiro, Nakamae, Koji |
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| Zdroj: | In Microelectronics Reliability September-November 2011 51(9-11):1624-1631 |
| Databáze: | ScienceDirect |
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