A study of SiC Power BJT performance and robustness
| Autor: | Castellazzi, A., Takuno, T., Onishi, R., Funaki, T., Kimoto, T., Hikihara, T. |
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| Zdroj: | In Microelectronics Reliability September-November 2011 51(9-11):1773-1777 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect