A reliable technology concept for active power cycling to extreme temperatures
| Autor: | Nelhiebel, M., Illing, R., Schreiber, C., Wöhlert, S., Lanzerstorfer, S., Ladurner, M., Kadow, C., Decker, S., Dibra, D., Unterwalcher, H., Rogalli, M., Robl, W., Herzig, T., Poschgan, M., Inselsbacher, M., Glavanovics, M., Fraissé, S. |
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| Zdroj: | In Microelectronics Reliability September-November 2011 51(9-11):1927-1932 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect