S-parameter performance degradation in power RF N-LDMOS devices due to hot carrier effects
| Autor: | Belaïd, M.A., Gares, M., Daoud, K., Eudeline, Ph. |
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| Zdroj: | In Microelectronics Reliability September-November 2011 51(9-11):1551-1556 |
| Databáze: | ScienceDirect |
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