Leakage current, active power, and delay analysis of dynamic dual Vt CMOS circuits under P–V–T fluctuations
| Autor: | Wang, Jinhui, Gong, Na, Hou, Ligang, Peng, Xiaohong, Sridhar, Ramalingam, Wu, Wuchen |
|---|---|
| Zdroj: | In Microelectronics Reliability September-November 2011 51(9-11):1498-1502 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect