Investigation of dynamic color deviation mechanisms of high power light-emitting diode

Autor: Fu, Han-Kuei, Lin, Chin-Wei, Chen, Tzung-Te, Chen, Chiu-Ling, Chou, Pei-Ting, Sun, Chien-Jen
Zdroj: In Microelectronics Reliability May 2012 52(5):866-871
Databáze: ScienceDirect