Investigation of dynamic color deviation mechanisms of high power light-emitting diode
Autor: | Fu, Han-Kuei, Lin, Chin-Wei, Chen, Tzung-Te, Chen, Chiu-Ling, Chou, Pei-Ting, Sun, Chien-Jen |
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Zdroj: | In Microelectronics Reliability May 2012 52(5):866-871 |
Databáze: | ScienceDirect |
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