Toward comprehensive reliability assessment of electronics by a combined loading approach
Autor: | Mattila, T.T., Paulasto-Kröckel, M. |
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Zdroj: | In Microelectronics Reliability 2011 51(6):1077-1091 |
Databáze: | ScienceDirect |
Externí odkaz: |
Autor: | Mattila, T.T., Paulasto-Kröckel, M. |
---|---|
Zdroj: | In Microelectronics Reliability 2011 51(6):1077-1091 |
Databáze: | ScienceDirect |
Externí odkaz: |