Improved performance of trench power MOSFET with SiGeC-based channel
Autor: | Wang, Ying, Hu, Hai-fan, Cheng, Chao |
---|---|
Zdroj: | In Microelectronics Reliability 2011 51(2):376-380 |
Databáze: | ScienceDirect |
Externí odkaz: |
Autor: | Wang, Ying, Hu, Hai-fan, Cheng, Chao |
---|---|
Zdroj: | In Microelectronics Reliability 2011 51(2):376-380 |
Databáze: | ScienceDirect |
Externí odkaz: |