Thermal aging model of InP/InGaAs/InP DHBT
| Autor: | Ghosh, S., Marc, F., Maneux, C., Grandchamp, B., Koné, G.A., Zimmer, T. |
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| Zdroj: | In Microelectronics Reliability 2010 50(9):1554-1558 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Ghosh, S., Marc, F., Maneux, C., Grandchamp, B., Koné, G.A., Zimmer, T. |
|---|---|
| Zdroj: | In Microelectronics Reliability 2010 50(9):1554-1558 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect