Defect-related degradation of Deep-UV-LEDs
| Autor: | Meneghini, M., Barbisan, D., Bilenko, Y., Shatalov, M., Yang, J., Gaska, R., Meneghesso, G., Zanoni, E. |
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| Zdroj: | In Microelectronics Reliability 2010 50(9):1538-1542 |
| Databáze: | ScienceDirect |
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