Reliability of planar, Super-Junction and trench low voltage power MOSFETs
| Autor: | Testa, A., De Caro, S., Panarello, S., Patanè, S., Russo, S., Patti, D., Poma, S., Letor, R. |
|---|---|
| Zdroj: | In Microelectronics Reliability 2010 50(9):1789-1795 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect