Interface traps density-of-states as a vital component for hot-carrier degradation modeling
| Autor: | Tyaginov, S.E., Starkov, I.A., Triebl, O., Cervenka, J., Jungemann, C., Carniello, S., Park, J.M., Enichlmair, H., Karner, M., Kernstock, Ch., Seebacher, E., Minixhofer, R., Ceric, H., Grasser, T. |
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| Zdroj: | In Microelectronics Reliability 2010 50(9):1267-1272 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect