Characteristics degradation of the SiGe HBT under electromagnetic field stress
| Autor: | Alaeddine, A., Kadi, M., Daoud, K., Beydoun, B. |
|---|---|
| Zdroj: | In Microelectronics Reliability 2010 50(12):1961-1966 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Alaeddine, A., Kadi, M., Daoud, K., Beydoun, B. |
|---|---|
| Zdroj: | In Microelectronics Reliability 2010 50(12):1961-1966 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect